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    CN

    SDC-580輪播大圖1.png
    SDC-580輪播大圖1.png

    SDC-580Fully automatic wafer contact angle measuring instrument

    Product Features

    • Unique design of the sample stage, specially designed for wafers;
    • Can meet 6-12 inch wafer samples for testing;
    • Matrix multi-point test, accurate and convenient test;
    • Measure 50 points at one time, display the data directly in the original image and save it;
    • Product description
    • Specification parameters
    • Hardware options
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